Publication Citation
NIST Authors in Bold
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| Author(s): | Michael T. Postek; |
|---|---|
| Title: | 2005 Metrology for a New Science: Advanced Metrology Needs |
| Published: | January 01, 2005 |
| Abstract: | |
| Proceedings: | Nanotechnology and Nanomanufacturing Micro Nano Breakthrough Conference |
| Location: | Portland, OR |
| Dates: | July 25-28, 2005 |
| Research Areas: | Metrology, Manufacturing |