Take a sneak peek at the new NIST.gov and let us know what you think!
(Please note: some content may not be complete on the beta site.).

View the beta site
NIST logo

Publication Citation: Dynamic Modeling and Vibration Analysis of a UHV Scanning Tunneling

NIST Authors in Bold

Author(s): Sumanth B. Chikkamaranahalli; R. R. Vallance; Bradley N. Damazo; Richard M. Silver; James D. Gilsinn;
Title: Dynamic Modeling and Vibration Analysis of a UHV Scanning Tunneling
Published: August 17, 2005
Abstract: Techniques based on scanning probe microscopy (SPM) are used to fabricate surface structures with dimensions ranging from 10 - 100mm. These structures have been fabricated and imaged using a scanning tunneling microscope (STM), and the STM requires the tip-sample distance to be controlled with picometer precision. This requirement must be satisfied in the presence of external vibrations with micrometer amplitude, temperature drifts and acoustic perturbations. In this manuscript, the results of dynamic modeling and vibration analysis of a STM that is currently being built and tested at the National Institute of Standards and Technology (NIST) are presented. The design of an eddy current damping system to isolate the STM unit from environment vibrations is also discussed.
Conference: Proceedings of the American Society for Precision Engineering 2005 Annual conference
Proceedings: ASME Annual Conference 2005
Location: Norfolk, VA
Dates: October 9-14, 2005
Keywords: eddy current damping,modal analysis,STM
Research Areas: Nanomanufacturing