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|Author(s):||Ndubuisi G. Orji; Theodore V. Vorburger; Xiaohong Gu; Jayaraman Raja;|
|Title:||Surface Metrology Software Variability in Two-Dimensional Measurements|
|Published:||January 01, 2003|
|Abstract:||A range of surface texture measurement instruments is available in the market place. Most of the measurement instruments are microcomputer-based systems that contain their own surface analysis software to evaluate measured roughness profiles. After a measurement is taken, data points representing a surface profile are filtered to remove unwanted wavelengths due to instrument noise, tool marks, or chatter, etc. Surface texture parameters are calculated based on the filtered profile and used to characterize the surface profile. Over a hundred parameters have been defined for industrial use, and many of these appear in national standards as well. Some standards organization such as ISO (International Organization of Standardization) and ASME (American Society of Mechanical Engineers) have different surface texture parameter definitions and evaluation procedures. Thus, different implementations can yield differences in results. This paper describes the results of a surface finish parameter round-robin variability investigation among commercial software packages for surface texture analysis. The parameters included in the study are Ra, Rq, Rsk, Rku, Rz, Rdq, Rp, Rv, Rt, and Rsm.|
|Conference:||American Society for Precision Engineering 2003 Annual Meeting|
|Proceedings:||Proceedings of American Society for Precision Engineering 2003 Annual Meeting|
|Pages:||pp. 419 - 422|
|Dates:||January 1, 2003|
|Research Areas:||Metrology, Manufacturing|