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NIST Authors in Bold
|Author(s):||Steven D. Phillips;|
|Title:||Measurement Uncertainty and Traceability Issues in National and International Measurements|
|Published:||May 01, 2003|
|Abstract:||This paper discusses some recent laboratory intercomparisons with emphasis on the success of the uncertainty statement to include the reference value. Some factors that affect this capability are discussed. Recently developed national and international standards in the area of measurement uncertainty are presented as resources for industrial metrologists.|
|Conference:||International Dimensional Metrology Workshop|
|Dates:||May 12-16, 2003|
|Research Areas:||Metrology, Manufacturing|