| Author(s): |
Dennis A. Swyt; Steven D. Phillips; J Palmateer; |
| Title: |
Some Developments at NIST on Traceability in Dimensional Measurements |
| Published: |
October 01, 2001 |
| Abstract: |
This paper reports to the international community on recent developments in technical ;policies, programs, and capabilities at the U.S. National Institute of Standards and Technology (NIST) related to traceability in dimensional measurements. These developments include: formal NIST policies on traceability and assuring quality in the results of the measurements it delivers to customers in calibration and measurement certificates, and a program to support the achievement of traceability to the SI unit of length in dimensional measurements by manufacturers without recourse to an NM1 for dimensional calibrations. |
| Conference: |
Establishing Direct Traceability on the Shop Floor |
| Proceedings: |
Proceedings of SPIE, Recent Developments in Traceable Dimensional Measurements, Jennifer E. Decker, Nicholas Brown, Editors |
| Volume: |
4401 |
| Pages: |
pp. 245 - 252 |
| Location: |
Munich, GE |
| Dates: |
June 27-28, 2001 |
| Keywords: |
calibration;dimensional measurement;SI unit of length;traceability |
| Research Areas: |
Metrology, Manufacturing |
