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|Author(s):||Dennis A. Swyt; Steven D. Phillips; J Palmateer;|
|Title:||Some Developments at NIST on Traceability in Dimensional Measurements|
|Published:||October 01, 2001|
|Abstract:||This paper reports to the international community on recent developments in technical ;policies, programs, and capabilities at the U.S. National Institute of Standards and Technology (NIST) related to traceability in dimensional measurements. These developments include: formal NIST policies on traceability and assuring quality in the results of the measurements it delivers to customers in calibration and measurement certificates, and a program to support the achievement of traceability to the SI unit of length in dimensional measurements by manufacturers without recourse to an NM1 for dimensional calibrations.|
|Conference:||Establishing Direct Traceability on the Shop Floor|
|Proceedings:||Proceedings of SPIE, Recent Developments in Traceable Dimensional Measurements, Jennifer E. Decker, Nicholas Brown, Editors|
|Pages:||pp. 245 - 252|
|Dates:||June 27-28, 2001|
|Keywords:||calibration,dimensional measurement,SI unit of length,traceability|
|Research Areas:||Metrology, Manufacturing|