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Publication Citation: Some Developments at NIST on Traceability in Dimensional Measurements

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Author(s): Dennis A. Swyt; Steven D. Phillips; J Palmateer;
Title: Some Developments at NIST on Traceability in Dimensional Measurements
Published: October 01, 2001
Abstract: This paper reports to the international community on recent developments in technical ;policies, programs, and capabilities at the U.S. National Institute of Standards and Technology (NIST) related to traceability in dimensional measurements. These developments include: formal NIST policies on traceability and assuring quality in the results of the measurements it delivers to customers in calibration and measurement certificates, and a program to support the achievement of traceability to the SI unit of length in dimensional measurements by manufacturers without recourse to an NM1 for dimensional calibrations.
Conference: Establishing Direct Traceability on the Shop Floor
Proceedings: Proceedings of SPIE, Recent Developments in Traceable Dimensional Measurements, Jennifer E. Decker, Nicholas Brown, Editors
Volume: 4401
Pages: pp. 245 - 252
Location: Munich, GE
Dates: June 27-28, 2001
Keywords: calibration,dimensional measurement,SI unit of length,traceability
Research Areas: Metrology, Manufacturing