| Author(s): |
Michael T. Postek; |
| Title: |
Traceable Standards for Scanning Electron Microscopy |
| Published: |
January 01, 1994 |
| Abstract: |
The emphasis on International Standards Organization (ISO) certification of laboratories has resulted in a renewed interest in NIST traceable standards for scanning electron microscopy (SEM). Under ISO certification, it is mandatory to calibrate and maintain the calibration of laboratory instrumentation. |
| Conference: |
Microscopy Society of America |
| Proceedings: |
Proceedings of Microscopy Society of America, John Friel, Editor |
| Pages: |
pp. 173 - 174 |
| Location: |
Unknown, USA |
| Dates: |
January 1, 1994 |
| Research Areas: |
Metrology, Manufacturing |
