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Publication Citation: Traceable Standards for Scanning Electron Microscopy

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Author(s): Michael T. Postek;
Title: Traceable Standards for Scanning Electron Microscopy
Published: January 01, 1994
Abstract: The emphasis on International Standards Organization (ISO) certification of laboratories has resulted in a renewed interest in NIST traceable standards for scanning electron microscopy (SEM). Under ISO certification, it is mandatory to calibrate and maintain the calibration of laboratory instrumentation.
Conference: Microscopy Society of America
Proceedings: Proceedings of Microscopy Society of America, John Friel, Editor
Pages: pp. 173 - 174
Location: Unknown, USA
Dates: January 1, 1994
Research Areas: Metrology, Manufacturing