Take a sneak peek at the new NIST.gov and let us know what you think!
(Please note: some content may not be complete on the beta site.).
NIST Authors in Bold
|Author(s):||Michael T. Postek;|
|Title:||Traceable Standards for Scanning Electron Microscopy|
|Published:||January 01, 1994|
|Abstract:||The emphasis on International Standards Organization (ISO) certification of laboratories has resulted in a renewed interest in NIST traceable standards for scanning electron microscopy (SEM). Under ISO certification, it is mandatory to calibrate and maintain the calibration of laboratory instrumentation.|
|Conference:||Microscopy Society of America|
|Proceedings:||Proceedings of Microscopy Society of America, John Friel, Editor|
|Pages:||pp. 173 - 174|
|Dates:||January 1, 1994|
|Research Areas:||Metrology, Manufacturing|