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|Author(s):||Steven D. Phillips; Bruce R. Borchardt; Daniel S. Sawyer; William T. Estler; K Eberhardt; M Levenson; Marjorie A. McClain; Ted Hopp;|
|Title:||A Constrained Monte Carlo Simulation Method for the Calculation of CMM Measurement Uncertainty|
|Published:||January 01, 1999|
|Abstract:||We describe a Monte Carlo simulation technique where known information about a metrology system is employed as a constraint to distinguish the errors associated with the instrument under consideration from the set of all possible instrument errors. The technique can effectively use incomplete information in the sense that the specific kinematic state of the instrument cannot be determined from the available information. We describe this method for the case of coordinate measuring machines using the ANSI/ASME B89.4.1 performance values as the constraints. Good agreement between the predicted task, specific measurement uncertainty, and the actual error is reported. The technique may employ any reasonable performance test values as the constraints and can be extended to other determinist systems, such as laser trackers and machine tools.|
|Citation:||Precision Engineering-Journal of the International Societies for Precision Engineering and Nanotechnology|
|Research Areas:||Metrology, Manufacturing|