| Author(s): |
Steven D. Phillips; William T. Estler; |
| Title: |
Calculation of Measurement Uncertainty Using Prior Information |
| Published: |
November 01, 1998 |
| Abstract: |
We describe the use of Bayesian inference to include prior information about the value of the measurand in the calculation of measurement uncertainty. Typical examples show this can, in effect, reduce the expanded uncertainty by up to 85 %. The application of the Bayesian approach to proving workpiece conformance to specification (as given by international standard ISO 14253-1) is presented and a procedure for increasing the conformance zone by modifying the expanded uncertainty guard bands is discussed. |
| Citation: |
Journal of Research of the National Institute of Standards and Technology |
| Volume: |
103(6) |
| Pages: |
pp. 625 - 632 |
| Keywords: |
Bayesian;bias;error;measurement uncertainty;uncertainty |
| Research Areas: |
Metrology, Manufacturing |
| PDF version: |
 Click here to retrieve PDF version of paper (116KB) |
