NIST Authors in Bold
| Author(s): | Theodore V. Vorburger; John A. Dagata; G. Wilkening; K Iizuka; |
|---|---|
| Title: | Industrial Uses of STM and AFM |
| Published: | January 01, 1997 |
| Abstract: | We review the field of STM and AFM as applied to industrial problems, and we classify the applications into four classes: research with potential benefit to industry, research performed by industry, applications off-line in manufacturing, and applications on-line in manufacturing. We also discuss the role of metrology for certain applications and briefly review many other types of SPMs besides STM and AFM. We conclude by emphasizing ultra-precision positioning, nanofabrication, and biomedical applications as important future directions in the field. |
| Citation: | Annals CIRP |
| Volume: | 47(2) |
| Pages: | pp. 597 - 620 |
| Keywords: | atomic force microscopy (AFM);Scanning probe microscopy (SPM);Scanning tunneling microscopy (STM) |
| Research Areas: | Metrology, Manufacturing |