| Author(s): |
Christopher J. Evans; R Hocken; William T. Estler; |
| Title: |
Self-Calibration: Reversal, Redundancy, Error Separation, and "Absolute Testing" |
| Published: |
January 01, 1996 |
| Abstract: |
Over the years many techniques have been developed for accurate measurement of part features without reference to an externally calibrated artifact. This paper presents a partial survey of such methods for dimensional metrology, their ranges of application. and their limits. Finally, the paper attempts to distill the common features of the various methods in the hope that this may provide the basis, or inspiration, for development of new methods. |
| Citation: |
Annals of the CIRP |
| Volume: |
45(2) |
| Keywords: |
dimensional metrology;kinematic error correction;quality assurance |
| Research Areas: |
Metrology, Manufacturing |
