NIST Authors in Bold
| Author(s): | Steven D. Phillips; Bruce R. Borchardt; William T. Estler; |
|---|---|
| Title: | The Estimation of Measurement Uncertainty of Small Circular Features Measured by CMMs |
| Published: | February 01, 1995 |
| Abstract: | This paper examines the measurement uncertainty of small circular features as a function of the sampling strategy, i.e., the number and distribution of measurement points. Specifically, we examine measuring a circular feature using a three-point sampling strategy in which the angular distance between the points varies from widely spaces, 120 degrees, to closely grouped, a few degrees. Both theoretical and experimental results show that the measurement uncertainty is a strong function of the sampling strategy. The uncertainty is shown to vary by four orders of magnitude as a function of the angular distribution of the measurement points. A conceptual framework for theoretically estimating the measuring uncertainty is described and a good agreement with experiment is obtained when the measurements are consistent with the assumptions of the theoretical model. |
| Citation: | NIST Interagency/Internal Report (NISTIR) - 5698 |
| Pages: | pp. 1 - 12 |
| Research Areas: | Metrology, Manufacturing |