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NIST Authors in Bold
|Author(s):||Steven D. Phillips; Bruce R. Borchardt; William T. Estler;|
|Title:||The Estimation of Measurement Uncertainty of Small Circular Features Measured by CMMs|
|Published:||February 01, 1995|
|Abstract:||This paper examines the measurement uncertainty of small circular features as a function of the sampling strategy, i.e., the number and distribution of measurement points. Specifically, we examine measuring a circular feature using a three-point sampling strategy in which the angular distance between the points varies from widely spaces, 120 degrees, to closely grouped, a few degrees. Both theoretical and experimental results show that the measurement uncertainty is a strong function of the sampling strategy. The uncertainty is shown to vary by four orders of magnitude as a function of the angular distribution of the measurement points. A conceptual framework for theoretically estimating the measuring uncertainty is described and a good agreement with experiment is obtained when the measurements are consistent with the assumptions of the theoretical model.|
|Citation:||NIST Interagency/Internal Report (NISTIR) - 5698|
|Pages:||pp. 1 - 12|
|Research Areas:||Metrology, Manufacturing|