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Publication Citation: TOF-SIMS Imaging of STM-Modified Semiconductor Surfaces

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Author(s): J. Bennett; John A. Dagata;
Title: TOF-SIMS Imaging of STM-Modified Semiconductor Surfaces
Published: January 01, 1994
Abstract: Not available.
Citation: Chapter in: Secondary Ion Mass Spectrometry SIMS IX, A. Benninghoven, et al., Editors
Publisher: John Wiley and Sons Ltd, Chichester, UK,
Pages: pp. 34 - 74
Research Areas: Metrology, Manufacturing