Publication Citation
NIST Authors in Bold
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| Author(s): | J. Bennett; John A. Dagata; |
|---|---|
| Title: | TOF-SIMS Imaging of STM-Modified Semiconductor Surfaces |
| Published: | January 01, 1994 |
| Abstract: | Not available. |
| Citation: | Chapter in: Secondary Ion Mass Spectrometry SIMS IX, A. Benninghoven, et al., Editors |
| Publisher: | John Wiley and Sons Ltd, Chichester, UK, |
| Pages: | pp. 34 - 74 |
| Research Areas: | Metrology, Manufacturing |