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PUBLICATIONS

TOF-SIMS Imaging of STM-Modified Semiconductor Surfaces

Published

Author(s)

J. Bennett, John A. Dagata

Abstract

Not available.
Citation
Chapter in: Secondary Ion Mass Spectrometry SIMS IX, A. Benninghoven, et al., Editors
Publisher Info
John Wiley and Sons Ltd, Chichester, UK,
Pub Type
Books
Metrology and Manufacturing

Citation

Bennett, J. and Dagata, J. (1994), TOF-SIMS Imaging of STM-Modified Semiconductor Surfaces, John Wiley and Sons Ltd, Chichester, UK, (Accessed April 20, 2024)

Created December 31, 1993, Updated October 12, 2021