| Author(s): |
Uwe Arz; Dylan F. Williams; Hartmut Grabinski; |
| Title: |
Experimental Study of the Ground Plane in Asymmetric Coupled Silicon Lines |
| Published: |
October 01, 2001 |
| Abstract: |
We use a measurement method designed for coupled lines on highly conductive substrates to characterize identical asymmetric coupled lines fabricated on lossy silicon with and without a metalization plane beneath the two signal conductors. The study illustrates the important role of the return path in determining the electromagnetic coupling between the lines. |
| Conference: |
2001 Elect. Perform. of Electronic Pkg. |
| Pages: |
pp. 317 - 320 |
| Location: |
Boston, MA |
| Dates: |
October 23-25, 2001 |
| Keywords: |
asymmetric coupled lines;ground return path;on-wafer measurement; |
| Research Areas: |
Microwave Measurement Services |
