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NIST Authors in Bold
|Author(s):||Uwe Arz; Dylan F. Williams; Hartmut Grabinski;|
|Title:||Experimental Study of the Ground Plane in Asymmetric Coupled Silicon Lines|
|Published:||October 01, 2001|
|Abstract:||We use a measurement method designed for coupled lines on highly conductive substrates to characterize identical asymmetric coupled lines fabricated on lossy silicon with and without a metalization plane beneath the two signal conductors. The study illustrates the important role of the return path in determining the electromagnetic coupling between the lines.|
|Conference:||2001 Elect. Perform. of Electronic Pkg.|
|Pages:||pp. 317 - 320|
|Dates:||October 23-25, 2001|
|Keywords:||asymmetric coupled lines,ground return path,on-wafer measurement|
|Research Areas:||Microwave Measurement Services|