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Publication Citation: Electrical Measurements for Electronic Interconnections at NIST

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Author(s): Dylan F. Williams; Donald C. DeGroot;
Title: Electrical Measurements for Electronic Interconnections at NIST
Published: August 01, 1999
Abstract: The National Institute of Standards and Technology (NIST) operates a number of research projects to advance measurement science and technology for the microelectronic industry. Here we will summarize (1), report on one component of the NIST program, the fundamental electrical characterization of electronic interconnections through accurate measurement.
Proceedings: Proc., URSI General Assembly
Pages: 1 pp.
Location: Toronto, CA
Dates: August 13-21, 1999
Keywords: ;electronic packaging;interconnections;measurements;network analysis;
Research Areas: Microwave Measurement Services