| Author(s): |
Dylan F. Williams; Donald C. DeGroot; |
| Title: |
Electrical Measurements for Electronic Interconnections at NIST |
| Published: |
August 01, 1999 |
| Abstract: |
The National Institute of Standards and Technology (NIST) operates a number of research projects to advance measurement science and technology for the microelectronic industry. Here we will summarize (1), report on one component of the NIST program, the fundamental electrical characterization of electronic interconnections through accurate measurement. |
| Proceedings: |
Proc., URSI General Assembly |
| Pages: |
1 pp. |
| Location: |
Toronto, CA |
| Dates: |
August 13-21, 1999 |
| Keywords: |
;electronic packaging;interconnections;measurements;network analysis; |
| Research Areas: |
Microwave Measurement Services |
