Publication Citation
NIST Authors in Bold
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| Author(s): | J R. Roberts; James K. Olthoff; Richard J. Van Brunt; James R. Whetstone; |
|---|---|
| Title: | Measurements on the NIST GEC Reference Cell |
| Published: | January 01, 1991 |
| Abstract: | |
| Proceedings: | Proc. Intl. Soc. for Optical Engineering (SPIE)Symp. on Advanced Techniques for Integrated Circuit Processing, |
| Location: | Santa Clara, CA |
| Dates: | October 1-5, 1990 |
| Research Areas: | Electronics & Telecommunications |