NIST Authors in Bold
| Author(s): | Harry A. Schafft; D F. Lee; P. E. Kennedy; |
|---|---|
| Title: | Building-In Reliability: Making It Work |
| Published: | May 01, 1991 |
| Abstract: | |
| Conference: | Reliability Physics Symposium, 1991, 29th Annual Proceedings., International |
| Location: | Las Vegas, NV |
| Dates: | April 9-11, 1991 |
| Research Areas: | Semiconductors |