NIST Authors in Bold
| Author(s): | James K. Olthoff; Yicheng Wang; |
|---|---|
| Title: | Studies of Ion Bombardment in High Density Plasmas Containing CF4 |
| Published: | July 01, 1999 |
| Abstract: | We report ion energy distributions, relative ion intensities, and absolute total ion current densities at the grounded electrode of an inductively coupled Gaseous Electronics Conference radio-frequency reference cell for discharges generated in pure C4, and in CF4: Ar and CF4:O2:Ar mixtures. Abundant ionic species, including secondary ions such as CO+ and COF+, were observed and their implications are discussed. |
| Citation: | Journal of Vacuum Science and Technology A |
| Issue: | 4 |
| Pages: | pp. 1552 - 1555 |
| Keywords: | ;carbon tetrafluoride;CF4;cleaning plasmas;etching plasmas;inductively coupled plasmas;ion energy distributions;ion flux; |
| Research Areas: | Electronics & Telecommunications |
| PDF version: | Click here to retrieve PDF version of paper (3MB) |