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Publication Citation: Improvements in Resistance Scaling at NIST Using Cryogenic Current Comparators

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Author(s): Ronald F. Dziuba; Randolph E. Elmquist;
Title: Improvements in Resistance Scaling at NIST Using Cryogenic Current Comparators
Published: June 01, 1992
Abstract:
Proceedings: Proc., Conference on Precision Electromagnetic Measurements (CPEM)
Pages: pp. 284 - 285
Location: Paris, FR
Dates: June 9-12, 1992
Research Areas: Quantum Electrical Measurements
PDF version: PDF Document Click here to retrieve PDF version of paper (1MB)