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|Author(s):||Uwe Arz; Howard C. Reader; Pavel Kabos; Dylan F. Williams;|
|Title:||Wideband Frequency-Domain Characterization of High-Impedance Probes|
|Published:||November 30, 2001|
|Abstract:||In this paper we investigate the broadband microwave properties of high-impedance probes designed for on-wafer waveform measurements. We show that the standard two-tier characterization method fails. We introduce two new methods of characterization, both of which yield equivalent results.|
|Conference:||58th Auto. RF Tech. Group Conference|
|Pages:||pp. 1 - 7|
|Location:||San Diego, CA|
|Dates:||November 29-30, 2001|
|Keywords:||frequency-domain characterization,high-impedance probes,on-wafer measurement|
|Research Areas:||Microwave Measurement Services|
|DOI:||http://dx.doi.org/10.1109/ARFTG.2001.327491 (Note: May link to a non-U.S. Government webpage)|
|PDF version:||Click here to retrieve PDF version of paper (149KB)|