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Publication Citation: Wideband Frequency-Domain Characterization of High-Impedance Probes

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Author(s): Uwe Arz; Howard C. Reader; Pavel Kabos; Dylan F. Williams;
Title: Wideband Frequency-Domain Characterization of High-Impedance Probes
Published: November 30, 2001
Abstract: In this paper we investigate the broadband microwave properties of high-impedance probes designed for on-wafer waveform measurements. We show that the standard two-tier characterization method fails. We introduce two new methods of characterization, both of which yield equivalent results.
Conference: 58th Auto. RF Tech. Group Conference
Volume: 40
Pages: pp. 1 - 7
Location: San Diego, CA
Dates: November 29-30, 2001
Keywords: frequency-domain characterization,high-impedance probes,on-wafer measurement
Research Areas: Microwave Measurement Services
DOI: http://dx.doi.org/10.1109/ARFTG.2001.327491  (Note: May link to a non-U.S. Government webpage)
PDF version: PDF Document Click here to retrieve PDF version of paper (149KB)