| Author(s): |
Uwe Arz; Howard C. Reader; Pavel Kabos; Dylan F. Williams; |
| Title: |
Wideband Frequency-Domain Characterization of High-Impedance Probes |
| Published: |
November 30, 2001 |
| Abstract: |
In this paper we investigate the broadband microwave properties of high-impedance probes designed for on-wafer waveform measurements. We show that the standard two-tier characterization method fails. We introduce two new methods of characterization, both of which yield equivalent results. |
| Conference: |
58th Auto. RF Tech. Group Conference |
| Pages: |
pp. 317 - 320 |
| Location: |
San Diego, CA |
| Dates: |
November 29-30, 2001 |
| Keywords: |
frequency-domain characterization;high-impedance probes;on-wafer measurement; |
| Research Areas: |
Microwave Measurement Services |
