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Publication Citation: Wideband Frequency-Domain Characterization of High-Impedance Probes

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Author(s): Uwe Arz; Howard C. Reader; Pavel Kabos; Dylan F. Williams;
Title: Wideband Frequency-Domain Characterization of High-Impedance Probes
Published: November 30, 2001
Abstract: In this paper we investigate the broadband microwave properties of high-impedance probes designed for on-wafer waveform measurements. We show that the standard two-tier characterization method fails. We introduce two new methods of characterization, both of which yield equivalent results.
Conference: 58th Auto. RF Tech. Group Conference
Pages: pp. 317 - 320
Location: San Diego, CA
Dates: November 29-30, 2001
Keywords: frequency-domain characterization;high-impedance probes;on-wafer measurement;
Research Areas: Microwave Measurement Services