Take a sneak peek at the new NIST.gov and let us know what you think!
(Please note: some content may not be complete on the beta site.).
NIST Authors in Bold
|Author(s):||Robert D. McMichael; Mark D. Stiles; P J. Chen; William F. Egelhoff Jr.;|
|Title:||Ferromagnetic Resonance Linewidth in Thin Films Coupled to NiO|
|Published:||January 01, 1998|
|Abstract:||The out-of-plane angular dependence of the ferromagnetic resonance linewidth, Δ H is described by nearly angle-independent damping parameters. In the NiO-coupled films, however, the damping was found to depend strongly on magnetization orientation, with linewidth values comparable to the control samples at normal orientation, but several times larger when the magnetization lies in plane. The additional linewidth in the NiO-coupled films follows the angular dependence of the number of nearly degenerate spin wave modes, in agreement with the predictions of a two-magnon scattering model of damping which incorporates a spin wave dispersion relation suitable for ultra-thin films.|
|Citation:||Journal of Applied Physics|
|Pages:||pp. 7037 - 7039|
|Keywords:||magnetic films,parameters spin wave modes,ultra-thin films|
|PDF version:||Click here to retrieve PDF version of paper (510KB)|