| Author(s): |
Paul Rice; Stephen E. Russek; J Hoinville; Michael H. Kelley; |
| Title: |
The NIST Magnetic Imaging Reference Sample |
| Published: |
January 01, 1997 |
| Abstract: |
We have further developed the NIST magnetic imaging reference sample to include a magnetic pattern which can indicate the magnetic polarity of a magnetic force microscope tip. Several samples cut from the same disk were measured with a single tip. We have also measured a single transition with several tips. Both measurement have shown the variability in images taken with differnt tips and different instrument configuration which underscores the need for a well calibrated sample. |
| Conference: |
Fourth Workshop on Industrial Applications of Scanned Probe Microscopy |
| Proceedings: |
Proceedings of the Fourth Workshop on Industrial Applications of Scanned Probe Microscopy |
| Location: |
Gaithersburg, MD |
| Dates: |
May 8, 1997 |
| Keywords: |
MICROSCOPY |
| Research Areas: |
Nanomagnetics |
| PDF version: |
 Click here to retrieve PDF version of paper (176KB) |
