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Publication Citation: Scanning Electron Microscopy with Polarization Analysis (SEMPA)

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Author(s): John NMN Unguris; M Scheinfein; Michael H. Kelley; A Gavrin; Robert Celotta; Daniel Thornton Pierce;
Title: Scanning Electron Microscopy with Polarization Analysis (SEMPA)
Published: January 01, 1997
Abstract: Scanning Electron Microscopy with Polarization Analysis (SEMPA) is a technique for the high spatial resolution imaging of magnetic microstructure. It employs a Scanning Electron Microscope (SEM) to create a finely focused electron beam on the surface of a ferromagnet; secondary electrons excited by the incident beam retain their spin-polarization when exiting the surface. A two dimensional map of the electron spinpolarization of these secondary electrons reveals the surface magnetization distribution for ferromagnetic (or ferrimagnetic) systems. This chapter describes salient features of the electron probe forming optics, the electron spin-polarization analyzers with associated transport optics, and the signal processing electronics. We also give examples illustrating how SEMPA provides high resolution magnetization images of various classes of micromagnetic structure.
Citation: Handbook of microscopy : applications in materials science, solid-state physics, and chemistry
Publisher: Wiley-VCH, Weinheim, DE
Pages: pp. 735 - 749
Keywords: None
Research Areas: Nanomagnetics
PDF version: PDF Document Click here to retrieve PDF version of paper (60KB)