Take a sneak peek at the new NIST.gov and let us know what you think!
(Please note: some content may not be complete on the beta site.).
NIST Authors in Bold
|Author(s):||John Unguris; M Scheinfein; Michael H. Kelley; A Gavrin; Robert Celotta; Daniel T. Pierce;|
|Title:||Scanning Electron Microscopy with Polarization Analysis (SEMPA)|
|Published:||January 01, 1997|
|Abstract:||Scanning Electron Microscopy with Polarization Analysis (SEMPA) is a technique for the high spatial resolution imaging of magnetic microstructure. It employs a Scanning Electron Microscope (SEM) to create a finely focused electron beam on the surface of a ferromagnet; secondary electrons excited by the incident beam retain their spin-polarization when exiting the surface. A two dimensional map of the electron spinpolarization of these secondary electrons reveals the surface magnetization distribution for ferromagnetic (or ferrimagnetic) systems. This chapter describes salient features of the electron probe forming optics, the electron spin-polarization analyzers with associated transport optics, and the signal processing electronics. We also give examples illustrating how SEMPA provides high resolution magnetization images of various classes of micromagnetic structure.|
|Citation:||Handbook of microscopy : applications in materials science, solid-state physics, and chemistry|
|Publisher:||Wiley-VCH, Weinheim, DE|
|Pages:||pp. 735 - 749|
|PDF version:||Click here to retrieve PDF version of paper (60KB)|