NIST Authors in Bold
| Author(s): | William F. Egelhoff Jr.; P J. Chen; Cedric J. Powell; Mark D. Stiles; Robert D. McMichael; |
|---|---|
| Title: | Growth of GMR Spin Valves using Indium as a Surfactant |
| Published: | January 01, 1996 |
| Abstract: | We have investigated the use of In as a surfactant to achieve smoother interfaces in spin-valve multilayers of the general type: FeMn/Ni80Fe20/Co/Cu/Co/Ni80Fe20/glass. The coupling field is reduced from ~0.8 to ~0.3 mT, presumably by suppressing roughness at the Co/Cu/Co interfaces, when 0.5-1.0 nm In is deposited on the first Co film just prior to Cu deposition or on the Cu film just prior to deposition of the second Co film. The In has a strong tendency to float-out to the surface during deposition of the spin valve leaving the spin-valve layers largely intact. The exchange bias at the FeMn/Ni80Fe20 interface can be increased from 12 to 25 mT by the use of thicker In(1.4 nm). |
| Citation: | Journal of Applied Physics |
| Volume: | 79 |
| Issue: | 5 |
| Pages: | pp. 2491 - 2496 |
| Research Areas: | Nanomagnetics |