Publication Citation
NIST Authors in Bold
 |
| Author(s): | Angela Davies; Joseph A. Stroscio; Daniel T. Pierce; John Unguris; Mark D. Stiles; Robert Celotta; |
|---|---|
| Title: | Characterization of Metallic Thin Film Growth by STM |
| Published: | January 01, 1996 |
| Abstract: | |
| Conference: | Workshop on Industrial Applications of Scanned Probe Microscopy |
| Proceedings: | Proceedings of the NIST Interagency Reports 5752 |
| Location: | Gaithersburg, MD |
| Dates: | May 3-4, 1995 |
| Keywords: | MICROSCOPY |
| Research Areas: | Scanning tunneling microscopy (STM) |