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Publication Citation: Characterization of Metallic Thin Film Growth by STM

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Author(s): Angela Davies; Joseph A. Stroscio; Daniel T. Pierce; John Unguris; Mark D. Stiles; Robert Celotta;
Title: Characterization of Metallic Thin Film Growth by STM
Published: January 01, 1996
Abstract:
Conference: Workshop on Industrial Applications of Scanned Probe Microscopy
Proceedings: Proceedings of the NIST Interagency Reports 5752
Location: Gaithersburg, MD
Dates: May 3-4, 1995
Keywords: MICROSCOPY
Research Areas: Scanning tunneling microscopy (STM)