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|Author(s):||M Scheinfein; John Unguris; M Aeschlimann; Daniel T. Pierce; Robert Celotta;|
|Title:||Scanning Electron Microscopy with Polarization Analysis (SEMPA) Studies of Domains, Domain Walls and Magnetic Singularities at Surfaces and in Thin Films|
|Published:||January 01, 1991|
|Abstract:||Scanning Electron Microscopy with Polarization Analysis (SEMPA) is used to investigate the surface magnetic microstructure of domain walls in thin permalloy films and the domain structure of magneto-optic TbFeCo alloys. Domain wall measurements confirm the results of micromagnetic theory.|
|Citation:||Journal of Magnetism and Magnetic Materials|
|Pages:||pp. 109 - 115|