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Publication Citation: Scanning Electron Microscopy with Polarization Analysis (SEMPA): Studies of Surface Magnetic Microstructure

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Author(s): M W. Hart; M Scheinfein; John Unguris; Daniel T. Pierce; Robert Celotta;
Title: Scanning Electron Microscopy with Polarization Analysis (SEMPA): Studies of Surface Magnetic Microstructure
Published: January 01, 1990
Abstract: SEMPA provides a new and versatile means of imaging surface magnetic microstructure with high resolution. When a ferromagnetic sample is probed by the highly focussed electron beam of an SEM, secondary electrons are generated whose spin polarization is directly proportional to the magnetization in the region sampled by the beam. By measuring this spoin polarization, the direction and magnitude of the sample magnetization can be imaged with 10 nm spatial resolution. A review of the SEMPA technique and recent results will be presented.
Conference: Symposium on Magnetic Materials, Processes and Devices
Location: Pennington, NJ
Dates: August 1, 1990
Research Areas: Nanomagnetics
PDF version: PDF Document Click here to retrieve PDF version of paper (130KB)