Publication Citation
NIST Authors in Bold
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| Author(s): | Shigeo Tanuma; Cedric J. Powell; David R. Penn; |
|---|---|
| Title: | Dependence of Inelastic Electron Mean Free Paths on Electron Energy and Material |
| Published: | January 01, 1987 |
| Abstract: | |
| Citation: | Analytical Electron Microscopy |
| Publisher: | San Francisco Press, San Francisco, CA |
| Pages: | pp. 356 - 358 |
| Research Areas: | Surface Physics |