NIST logo

Publication Citation: Scanning Electron Microscopy with Polarization Analysis (SEMPA): High Spatial Resolution Magnetic Imaging Status Report

NIST Authors in Bold

Author(s): M Scheinfein; John Unguris; Daniel T. Pierce; Robert Celotta;
Title: Scanning Electron Microscopy with Polarization Analysis (SEMPA): High Spatial Resolution Magnetic Imaging Status Report
Published: January 01, 1988
Abstract: The scanning electron microscopy with polarization analysis (SEMPA) technique as a means of observing magnetic microstructure is surveyed. A brief description of the technique is given. Particular emphasis is paid to the spin-polarization detector as the critical element in the SEMPA system.
Proceedings: NSF/CNRS Workshop on Electron Beam Induced High Spatial Resolution Spectroscopies
Location: Aussois, France
Dates: February 28-March 5, 1988
Keywords: ELECTRON;SPECTROSCOPIES;SPECTROSCOPY
Research Areas: Nanomagnetics
PDF version: PDF Document Click here to retrieve PDF version of paper (255KB)