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Publication Citation: Scanning Electron Microscopy with Secondary Electron Spin Polarization Analysis: A New Probe of Magnetic Microstructure

NIST Authors in Bold

Author(s): John Unguris; G Hembree; Daniel T. Pierce; Robert Celotta;
Title: Scanning Electron Microscopy with Secondary Electron Spin Polarization Analysis: A New Probe of Magnetic Microstructure
Published: January 01, 1985
Abstract:
Conference: 45th Annual Conference on Physical Electronics
Location: Milwaukee, WI
Dates: January 1, 1985
Research Areas: Nanomagnetics