NIST Authors in Bold
| Author(s): | John Unguris; G Hembree; Daniel T. Pierce; Robert Celotta; |
|---|---|
| Title: | Scanning Electron Microscopy with Secondary Electron Spin Polarization Analysis: A New Probe of Magnetic Microstructure |
| Published: | January 01, 1985 |
| Abstract: | |
| Conference: | 45th Annual Conference on Physical Electronics |
| Location: | Milwaukee, WI |
| Dates: | January 1, 1985 |
| Research Areas: | Nanomagnetics |