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|Author(s):||Cedric J. Powell;|
|Title:||Quantitative Surface Analysis by Electron Spectroscopy|
|Published:||April 01, 1978|
|Abstract:||An overview is given of a new cooperative project under the Implementing Agreement between the Technology Administration, U.S. Department of Commerce, and the Agency of Industrial Science and Technology, Japanese Ministry of International Trade and Industry on Cooperation in Research and Development in Civil Industrial Technology. This new project aims to provide more accurate measurement of a key parameter, the inelastic mean free path, that is needed for quantitative surface analysis of advanced materials, in general, and of catalysts in particular. Initial plans for the project are described.|
|Keywords:||catalysis,electron inelastic mean free path,surface analysis,x-ray photoelectron spectroscopy|
|Research Areas:||Surface Physics|