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NIST Authors in Bold
|Author(s):||Cedric J. Powell;|
|Title:||The Physica B&Cl Basis for Quantitative Surface Analysis by Auger Electron Spectroscopy and X-Ray Photoelectron Spectroscopy|
|Published:||January 01, 1978|
|Abstract:||A review is given of the physical basis for quantitative surface analysis by Auger electron spectroscopy (AES) and by X-ray photoelectron spectroscopy (XPS) or electron spectroscopy for chemical analysis (ESCA). The principal topics discussed are: the feasibility of surface analysis, approaches to surface analysis, description of models and data for surface analysis by AES and XPS, analytical methods, intensity measurements, practical consideration, applications and reference materials.|
|Conference:||Quantitative surface analysis of materials|
|Proceedings:||Quantitative surface analysis of materials : a symposium|
|Pages:||pp. 5 - 30|
|Dates:||March 2-3, 1977|
|Research Areas:||Surface Physics|