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Publication Citation: The Physica B&Cl Basis for Quantitative Surface Analysis by Auger Electron Spectroscopy and X-Ray Photoelectron Spectroscopy

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Author(s): Cedric J. Powell;
Title: The Physica B&Cl Basis for Quantitative Surface Analysis by Auger Electron Spectroscopy and X-Ray Photoelectron Spectroscopy
Published: January 01, 1978
Abstract: A review is given of the physical basis for quantitative surface analysis by Auger electron spectroscopy (AES) and by X-ray photoelectron spectroscopy (XPS) or electron spectroscopy for chemical analysis (ESCA). The principal topics discussed are: the feasibility of surface analysis, approaches to surface analysis, description of models and data for surface analysis by AES and XPS, analytical methods, intensity measurements, practical consideration, applications and reference materials.
Conference: Quantitative surface analysis of materials
Proceedings: Quantitative surface analysis of materials : a symposium
Volume: 643
Pages: pp. 5 - 30
Location: Cleveland, OH
Dates: March 2-3, 1977
Research Areas: Surface Physics