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|Author(s):||Cedric J. Powell;|
|Title:||Quantitative Surface Analysis by X-Ray Photoelectron Spectroscopy|
|Published:||January 01, 1978|
|Abstract:||Measurements have been made of the relative intensities of the principal features in X-ray photoelectron spectra of indium, lead, and aluminum oxide and compared with those expected from a simple model for the photoemission process. Systematic effects in the determination of line intensities are discussed and a suitable procedure for determining intensities is described. The satisfactory agreement between computed and measured intensities confirms the validity and utility of the photoemission model and associated data, and indicates that quantitative analyses of homogeneous single-phase surfaces can be obtained by X-ray photoelectron spectroscopy.|
|Citation:||Applications of Surface Science|
|Pages:||pp. 186 - 201|
|Research Areas:||Surface Physics|