Take a sneak peek at the new NIST.gov and let us know what you think!
(Please note: some content may not be complete on the beta site.).
NIST Authors in Bold
|Title:||Electron Transmission Measurements of Electron Mean Free Path in Supported Thin Films from 1-5 keV|
|Published:||November 02, 1976|
|Abstract:||Measurements are made of the transmission of medium energy electrons through in vacuo deposited films in order to determine the inelastic electron mean free path as a function of energy. Films of Al, Ge and Au are deposited in small increments on 20-30 ¿ carbon substrates supported by "holey" carbon films. The no-loss electron current is measured for each thickness as a continuous function of incident energy in the range of 1-5 keV. Although this preliminary experiment does not result in a precise separation of elastic and inelastic scattering effects, the attenuation lengths estimated are in reasonable agreement with measured and calculated in-elastic mean free paths. Elastic scattering cross sections appear to be smaller than estimated by simple theory.|
|Pages:||pp. 436 - 444|
|Research Areas:||Surface Physics|