Take a sneak peek at the new NIST.gov and let us know what you think!
(Please note: some content may not be complete on the beta site.).

View the beta site
NIST logo

Publication Citation: Field-Ion Microscopy of Silicon

NIST Authors in Bold

Author(s): A J. Melmed; R Stein;
Title: Field-Ion Microscopy of Silicon
Published: April 02, 1975
Abstract:
Citation: Surface Science
Volume: 49
Issue: 2
Pages: pp. 645 - 648
Research Areas: Surface Physics