NIST Authors in Bold
| Author(s): | Alan H. Band; George A. Klouda; Stephen H. Pheiffer; |
|---|---|
| Title: | A Highly Flexible, Minimum Dead Time, Data Intensive Acquisition System for Characterizing Low Level Decay Events Constructed with Commericial Off-the-Shelf Hardware |
| Published: | January 01, 2007 |
| Abstract: | |
| Citation: | Journal of Radioanalytical and Nuclear Chemistry |
| Research Areas: | Instrumentation |