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NIST Authors in Bold
|Author(s):||Alan H. Band; George A. Klouda; Stephen H. Pheiffer;|
|Title:||A Highly Flexible, Minimum Dead Time, Data Intensive Acquisition System for Characterizing Low Level Decay Events Constructed with Commericial Off-the-Shelf Hardware|
|Published:||January 01, 2007|
|Citation:||Journal of Radioanalytical and Nuclear Chemistry|