NIST Authors in Bold
| Author(s): | Marvin E. Cage; D. Y. Yu; B. Jeckelmann; Richard L. Steiner; R. V. Duncan; |
|---|---|
| Title: | Investigating the Use of Multimeters to Measure Quantized Hall Resistance Standards |
| Published: | June 01, 1990 |
| Abstract: | |
| Proceedings: | Proc., Conference on Precision Electromagnetic Measurements (CPEM) |
| Pages: | pp. 332 - 333 |
| Location: | Ottawa, CA |
| Dates: | June 11-14, 1990 |
| Research Areas: | Quantum Electrical Measurements |
| PDF version: | Click here to retrieve PDF version of paper (874KB) |