| Author(s): |
Lawrence P. Dunleavy; James P. Randa; David K. Walker; Robert L. Billinger; Joseph P. Rice; |
| Title: |
Characterization and Applications of On-Wafer Diode Noise Sources |
| Published: |
December 01, 1998 |
| Abstract: |
A set of wafer-probeable diode noise source transfer standards are characterized using on-wafer noise-temperature methods developed at the National Institute of Standards and Technology (NIST), Boulder, CO. |
| Citation: |
IEEE Transactions on Microwave Theory and Techniques |
| Volume: |
46 |
| Issue: |
12 |
| Pages: |
pp. 2620 - 2628 |
| Keywords: |
;noise;noise measurement;on-wafer noise;noise characterization;noise temperature; |
| Research Areas: |
Electronics & Telecommunications, Microelectronics, Electromagnetics |
| PDF version: |
 Click here to retrieve PDF version of paper (233KB) |
