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Publication Citation: Characterization and Applications of On-Wafer Diode Noise Sources

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Author(s): Lawrence P. Dunleavy; James P. Randa; David K. Walker; Robert L. Billinger; Joseph P. Rice;
Title: Characterization and Applications of On-Wafer Diode Noise Sources
Published: December 01, 1998
Abstract: A set of wafer-probeable diode noise source transfer standards are characterized using on-wafer noise-temperature methods developed at the National Institute of Standards and Technology (NIST), Boulder, CO.
Citation: IEEE Transactions on Microwave Theory and Techniques
Volume: 46
Issue: 12
Pages: pp. 2620 - 2628
Keywords: ;noise;noise measurement;on-wafer noise;noise characterization;noise temperature;
Research Areas: Electronics & Telecommunications, Microelectronics, Electromagnetics
PDF version: PDF Document Click here to retrieve PDF version of paper (238KB)