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NIST Authors in Bold
|Author(s):||William F. Guthrie; Hung-Kung Liu; Andrew L. Rukhin; Blaza Toman; Chih-Ming Wang; Nien F. Zhang;|
|Title:||Three Statistical Paradigms for the Assessment and Interpretation of Measurement Uncertainty|
|Published:||January 12, 2009|
|Abstract:||The goals of this chapter are to present different approaches to uncertainty assessment from a statistical point of view and to relate them to the methods that are currently being used in metrology or are being developed within the metrology community. The particular statistical paradigms under which different methods for uncertainty assessment will be described include the frequentist, Bayesian, and fiducial paradigms.|
|Citation:||Book chapter in Advances in Data Modeling for Measurements i|
|Pages:||pp. 71 - 115|