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Publication Citation: IPOG/IPOG-D: Efficient Test Generation for Multi-way Combinatorial Testing

NIST Authors in Bold

Author(s): Yu Lei; Raghu N. Kacker; David R. Kuhn; Vadim Okun; James F. Lawrence;
Title: IPOG/IPOG-D: Efficient Test Generation for Multi-way Combinatorial Testing
Published: November 29, 2007
Abstract: We present two strategies for multi-way testing (i.e., t-way testing with t > 2). The first strategy generalizes an existing strategy, called In-Parameter-Order, from pairwise testing to multi-way testing. This strategy requires all t-way combinations to be explicitly enumerated. When the number of t-way combinations is large, however, explicit enumeration can be prohibitive both in terms of the space for storing these combinations and the time needed to enumerate them. To alleviate this problem, the second strategy combines the first strategy with a recursive construction procedure to reduce the number of t-way combinations that have to be enumerated. Both strategies are deterministic, i.e., they always produce the same test set for the same system configuration. We describe a t-way testing tool called FireEye and provide both analytic and experimental evaluation of the two strategies.
Citation: Software Testing Verification & Reliability
Volume: 18
Issue: 3
Pages: pp. 125 - 148
Keywords: combinatorial testing,interaction testing,multi-way testing,software testing
Research Areas: Math, Software
DOI: http://dx.doi.org/10.1002/stvr.381  (Note: May link to a non-U.S. Government webpage)