| Author(s): |
Jolene D. Splett; Chih-Ming Wang; |
| Title: |
Uncertainty in Reference Values for the Charpy V-notch Verification Program |
| Published: |
May 01, 2005 |
| Abstract: |
We present a method for computing the combined standard uncertainty for reference values used in the Charpy machine verification program administered by the National Institute of Standards and Technology. The technique is compliant with the ISO GUM and models the between-machine bias using a Type B distribution. We demonstrate the method using actual data from the Charpy machine verification program. |
| Citation: |
Journal of Testing and Evaluation |
| Volume: |
34 No 3 |
| Keywords: |
charpy v-notch;impact certification program;impact testing;ISO GUM;notched-bar testing;reference specimens;uncertainty |
| Research Areas: |
Statistics |
| PDF version: |
 Click here to retrieve PDF version of paper (60KB) |
