Take a sneak peek at the new NIST.gov and let us know what you think!
(Please note: some content may not be complete on the beta site.).
NIST Authors in Bold
|Author(s):||Davor Balzar; N C. Popa;|
|Title:||Analyzing Microstructure by Rietveld Refinement|
|Published:||June 01, 2005|
|Abstract:||Rietveld refinement has a primary purpose of refining crystal structure. However, this powerful technique is being increasingly used for obtaining microstructural information, such as texture, crystallite size, strain and stress, and crystalline defect concentration. The review discusses determination of these properties in Rietveld-refinement programs with especial emphasis on the modeling of diffraction-line broadening and diffraction-line shift.|
|Pages:||pp. 16 - 25|
|Keywords:||crystallite size,diffraction,microstructure,Rietveld refinement,strain|
|Research Areas:||Metals, Materials performance, Materials Science|
|PDF version:||Click here to retrieve PDF version of paper (404KB)|