NIST Authors in Bold
| Author(s): | C. Alexander; J. Rantschler; Thomas J. Silva; Pavel Kabos; |
|---|---|
| Title: | Frequency- and Time-resolved measurements of FeTaN Films with Longitudinal Bias Field |
| Published: | May 01, 2000 |
| Abstract: | |
| Citation: | Journal of Applied Physics |
| Volume: | 87 |
| Issue: | 9 |
| Pages: | pp. 6633 - 6635 |
| Research Areas: | Electromagnetics |
| PDF version: | Click here to retrieve PDF version of paper (63KB) |