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|Author(s):||Uwe Arz; Dylan F. Williams; Hartmut Grabinski;|
|Title:||Characteristic Impedance Measurement of Planar Transmission Lines|
|Published:||August 17, 2002|
|Abstract:||In this paper we investigate a simple, robust and general method to determine the characteristic impedance of planar transmission lines based on calibration comparison. We apply the method to different types of planar transmission lines like CPW and microstrip on lossless substrates, and to lines on lossy silicon typical of high-speed interconnects including VLSI interconnects.|
|Conference:||2002 URSI General Assembly|
|Pages:||pp. 1 - 4|
|Dates:||August 17-24, 2002|
|Keywords:||characteristic impedance,on-wafer measurement,planar transmission lines|
|Research Areas:||Microwave Measurement Services|
|PDF version:||Click here to retrieve PDF version of paper (153KB)|