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Publication Citation: Uncertainty Analysis for Noise-Parameter Measurements at NIST

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Author(s): James P. Randa;
Title: Uncertainty Analysis for Noise-Parameter Measurements at NIST
Published: April 09, 2009
Abstract: The uncertainty analysis is presented for NIST measurements of noise parameters of amplifiers and transistors, in both connectorized (coaxial) and on-wafer environments. We treat both the X-parameters, which are based on the wave representation of the noise correlation matrix, and the traditional IEEE noise parameters.
Citation: IEEE Transactions on Instrumentation and Measurement
Volume: 58
Issue: No:4
Pages: pp. 1146 - 1151
Keywords: amplifier noise, measurement uncertainty, Monte Carlo, noise measurement, noise figure, noise parameters, transistor noise,uncertainty
Research Areas: Electronics & Telecommunications, Nanoelectronics and Nanoscale Electronics, Electromagnetics
PDF version: PDF Document Click here to retrieve PDF version of paper (141KB)