| Author(s): |
James P. Randa; |
| Title: |
Uncertainty Analysis for Noise-Parameter Measurements at NIST |
| Published: |
April 09, 2009 |
| Abstract: |
The uncertainty analysis is presented for NIST measurements of noise parameters of amplifiers and transistors, in both connectorized (coaxial) and on-wafer environments. We treat both the X-parameters, which are based on the wave representation of the noise correlation matrix, and the traditional IEEE noise parameters. |
| Citation: |
IEEE Transactions on Instrumentation and Measurement |
| Volume: |
58 |
| Issue: |
No:4 |
| Pages: |
pp. 1146 - 1151 |
| Keywords: |
amplifier noise, measurement uncertainty, Monte Carlo, noise measurement, noise figure, noise parameters, transistor noise,uncertainty |
| Research Areas: |
Electronics & Telecommunications, Nanoelectronics and Nanoscale Electronics, Electromagnetics |
| PDF version: |
 Click here to retrieve PDF version of paper (138KB) |
