NIST Authors in Bold
| Author(s): | Behrang H. Hamadani; Curt A. Richter; John S. Suehle; David J. Gundlach; |
|---|---|
| Title: | Insights into the Characterization of Polymer-Based Organic Thin-Film Transistors Using Capacitance-Voltage Analysis |
| Published: | May 21, 2008 |
| Abstract: | Frequency dependent capacitance-voltage characteristics of organic thin-film transistors (OTFTs) based on poly(3-hexylthiophene) (p3HT) as the active polymer layer is investigated. The frequency response of the channel capacitance in accumulation is examined through an analytical transmission line model, with the effect of contact resistances included in the model to account for deviations from ideal behavior. The model provides an excellent fit to the data. Furthermore, the utility of the technique in extracting device parameters such as the mobility, the contact resistance and the influence of charge trapping on transport is discussed. |
| Citation: | Applied Physics Letters |
| Volume: | 92 |
| Pages: | 3 pp. |
| Keywords: | organic thin film transistors, CV measurement, contact effects |
| Research Areas: | Thin-Films |
| PDF version: | Click here to retrieve PDF version of paper (2MB) |