Take a sneak peek at the new NIST.gov and let us know what you think!
(Please note: some content may not be complete on the beta site.).
NIST Authors in Bold
|Author(s):||James P. Randa; Ken Wong; Roger Pollard;|
|Title:||SIMULATIONS OF NOISE-PARAMETER VERIFICATION USING CASCADE WITH ISOLATOR OR MISMATCHED TRANSMISSION LINE|
|Published:||November 30, 2007|
|Abstract:||Results are presented for simulations of a verification process for noise-parameter measurements. The verification process consists of first measuring separately both a passive device and the amplifier or transistor of interest (the DUT) and then measuring the tandem configuration of passive device plus DUT. The results of the measurements of the tandem configuration are then compared to the predictions obtained by cascading the noise parameters and S-parameters of the two individual components. In order that the comparisons be meaningful, uncertainties are computed for both predictions and simulated measurements.|
|Proceedings:||ARFTG 70TH MICROWAVE MEASUREMENT SYMPOSIUM|
|Pages:||pp. 77 - 83|
|Dates:||November 27-30, 2007|
|Keywords:||Amplifier noise, measurement uncertainties, noise measurements, noise parameters, transistor noise, verification methods.|
|Research Areas:||Electromagnetics, Microelectronics, Microwave Measurement Services|
|PDF version:||Click here to retrieve PDF version of paper (142KB)|