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NIST Authors in Bold
|Author(s):||Oana Jurchescu; Behrang H. Hamadani; Hao Xiong; Sungkyu Park; Sankar Subramanian; Neil M. Zimmerman; John E. Anthony; Thomas Jackson; David J. Gundlach;|
|Title:||Correlation Between Microstructure, Electronic Properties and Ficker Noise in Organic Thin Film Transistors|
|Published:||March 31, 2008|
|Abstract:||We report on observations of a direct correlation between the microstructure of the organic thin films and their electronic properties when incorporated in field-effect transistors. We present a simple method to induce enhanced grain growth in solution-processed 5,11-bis(triethylsilylethynyl)anthradithiophene thin film transistors by chemical modification of the source-drain contacts. This leads to improved device performance, and gives unique thin film microstructure for fundamental studies concerning the effect of structural order on the charge transport. Furthermore, we demonstrate that the 1/f flicker noise is sensitive to structural changes in the transistor channel and can be a diagnostic tool for the quality of the devices.|
|Citation:||Applied Physics Letters|
|Pages:||pp. 132103-1 - 132103-3|
|Keywords:||Flicker Noise,Microstructure,Mobility,Organic,Thin Film Transistor|
|Research Areas:||Nanoelectronics and Nanoscale Electronics|