| Author(s): |
Bill F. Riddle; Michael D. Janezic; |
| Title: |
Complex Permittivity Measurements at Millimeter Wave Frequencies |
| Published: |
April 23, 2007 |
| Abstract: |
Contemporary circuit designers are requiring larger bandwidths from microsystems to accomodate the ever-increasing demand for denser content. The electrical performance of these microsystems is intrisically related to the electromagnetic properties of the materials. Methods using the Fabry-Perot resonator (FPR) have found widespread use in systems developed for measuring material properties at millimeter wave frequencies. This paper will provide a brief overview of the theory and methodology of Fabry-Perot resonators and present measurements of selected materials made with the FPR system currently in use at the National Institute of Standards and Technology (NIST). |
| Conference: |
IMAPS/ACerS 3rd International Conference and Exhibition on Ceramic Interconnect and Ceramic Microsystems Technologies |
| Location: |
Denver, CO |
| Dates: |
April 23-26, 2007 |
| Keywords: |
complex permittivity;Fabry-Perot resonator;millimeter waves |
| Research Areas: |
Electromagnetics |
| PDF version: |
 Click here to retrieve PDF version of paper (241KB) |
