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|Author(s):||Billy F. Riddle; Michael D. Janezic;|
|Title:||Complex Permittivity Measurements at Millimeter Wave Frequencies|
|Published:||April 23, 2007|
|Abstract:||Contemporary circuit designers are requiring larger bandwidths from microsystems to accomodate the ever-increasing demand for denser content. The electrical performance of these microsystems is intrisically related to the electromagnetic properties of the materials. Methods using the Fabry-Perot resonator (FPR) have found widespread use in systems developed for measuring material properties at millimeter wave frequencies. This paper will provide a brief overview of the theory and methodology of Fabry-Perot resonators and present measurements of selected materials made with the FPR system currently in use at the National Institute of Standards and Technology (NIST).|
|Conference:||IMAPS/ACerS 3rd International Conference and Exhibition on Ceramic Interconnect and Ceramic Microsystems Technologies|
|Dates:||April 23-26, 2007|
|Keywords:||complex permittivity,Fabry-Perot resonator,millimeter waves|
|PDF version:||Click here to retrieve PDF version of paper (247KB)|