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Publication Citation: Reliability and Characterization Challenges for Nano-Scale Electronic Devices

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Author(s): John S. Suehle; Hao Xiong; Moshe Gurfinkel;
Title: Reliability and Characterization Challenges for Nano-Scale Electronic Devices
Published: March 14, 2007
Abstract: Scaling electronic devices to nano-scale dimensions may introduce unforeseen physical mechanisms that may seriously compromise device reliability. It has been discussed that as individual atoms comprise a larger fraction of the actual device area, defects associated with atomic-level changes may dominate failure and drift mechanisms. Also, it is expected that failure distributions will become more dispersed as the activation energy for defect generation is not expressed as a single value but as a distribution of values.
Proceedings: Nano and Giga Challenges in Electronics and Photonics
Pages: 1 pp.
Location: Phoenix, AZ
Dates: March 14-16, 2007
Keywords: Failure Mechanisms;Nanoelectronics;Reliability
Research Areas: Semiconductors
PDF version: PDF Document Click here to retrieve PDF version of paper (56KB)