Take a sneak peek at the new NIST.gov and let us know what you think!
(Please note: some content may not be complete on the beta site.).
NIST Authors in Bold
|Author(s):||John S. Suehle; Hao Xiong; Moshe Gurfinkel;|
|Title:||Reliability and Characterization Challenges for Nano-Scale Electronic Devices|
|Published:||March 14, 2007|
|Abstract:||Scaling electronic devices to nano-scale dimensions may introduce unforeseen physical mechanisms that may seriously compromise device reliability. It has been discussed that as individual atoms comprise a larger fraction of the actual device area, defects associated with atomic-level changes may dominate failure and drift mechanisms. Also, it is expected that failure distributions will become more dispersed as the activation energy for defect generation is not expressed as a single value but as a distribution of values.|
|Proceedings:||Nano and Giga Challenges in Electronics and Photonics|
|Dates:||March 14-16, 2007|
|PDF version:||Click here to retrieve PDF version of paper (56KB)|