Take a sneak peek at the new NIST.gov and let us know what you think!
(Please note: some content may not be complete on the beta site.).
NIST Authors in Bold
|Author(s):||David G. Seiler; John S. Suehle;|
|Title:||Metrology in the Nanoelectronics Era: Collaborative Innovation Between NIST and Industry|
|Published:||November 01, 2006|
|Abstract:||This special article in Semiconductor International discusses NIST's role in metrology for the semiconductor industry as it moves to the nanoscale regime.|
|Pages:||pp. 92 - 92|
|Research Areas:||Advanced Materials|